Utilizing the technique called focused ion beam – scanning electron microscopy (FIB-SEM), a study investigated the high capability thin-film solar cells which are made of Cu(In,Ga)Se2. Samples were ...
In this interview, AZoM speaks to Dr. Dean Miller, Senior Scientist at TESCAN Group, about how plasma FIB-SEM can be used to accelerate multi-modal materials characterization. FIB-SEM is based on a ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback