Frenchtown, N.J. — Aries Electronics has introduced a new center probe RF test socket designed specifically for use with Delta handlers. The new test sockets incorporate built-in, replaceable, ...
Contact resistance, or CRES, is one of those problems that most engineers prefer not to think about until it’s staring them in the face. For years, it could be managed quietly with routine probe card ...
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
The AI boom is injecting momentum into various industries, including the semiconductor testing solutions sector, where suppliers see strong demand for wafer probe cards and IC test sockets, according ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
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