The µHELIX® line of durable, fine-pitch probes is designed to test electrical targets with ±15-micron pointing accuracy on 10-mil center-to-center placement. Probe diameter sizes are 20, 16, 12, and 8 ...
When combined with today's high-bandwidth scopes, active test probes can make a world of difference in capturing serial data streams. This Engineering Essentials article covers the basics of active ...
Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...
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